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البحوث العلمية

2021

The Influence of Different Thickness on The Physical Properties of Tio2 Thin Films Prepared by Chemical Thermal Evaporation

2021-05
The journal of Duhok (القضية : 2021) (الحجم : 24)
TiO2 thin films with different thickness on some substrates of glass by using thermal evaporation method. The result of optical properties illustrated that the best transmitted appeared at thickness (100 nm) and 900 nm wavelengths with a value equal to 78.2%. The observed band gap value of the direct tran­sitions energy 3.69 eV for 150 nm, 2.95 eV for 300 nm and 2.45 eV for 450 nm
2020

CdO/FTO Schottky photodetector with enhanced spectral responsivity and Specific detectivity prepared by electrolysis method

2020-11
Journal of Physics: Conference Series (القضية : 2020) (الحجم : 0.7)
One of the important materials for applications in many photoelectric filed [just like solar cell, optoelectronic and other kinds on devices] is cadmium oxide thin films. There are several physical or chemical synthetic methods have been used to prepare transparent CdO films as described by many researchers. The X-ray diffraction study has confirmed the formation of CdO with nano-size scale. For this research CdO/FTO thin film has been prepared by electrolysis. The thin film is investigated by XRD, SEM and AFM surface morphology properties. XRD analysis showed that CdO films are a polycrystalline and exhibit cubic crystal structure with (111, 200, 311 and 222) orientation and the preferred orientation is 111. AFM and SEM were applied to study the morphology and estimate the surface roughness of the films obtained. (RMS) found that film roughness was 21.7 nm. The CdO film are n-type semiconductors and possess a direct optical band gap around 2.4 eV as shown in optical property studies.

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