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Conference

2019

Nanotechnology and Enhancement of Solar Efficiency and the Electrical Properties of Conducting Polymers

2019-12
3rd National Nanotechnology Workshop, Tishk International University, Erbil, Kurdistan Region-Iraq
N

Bologna Process

2019-04
Second Educational Conference of Colleges of Basic Education in Kurdistan Region, Salahaddin University-Erbil, Kurdistan Region-Iraq
N
2018

Effects of Substrate Orientation on the Solar Efficiency and the Electrical Properties of Conducting Polymer grown on GaAs

2018-10
Iraqi-German Winter School on Nanophotonics, Delmenhorst, Germany
N

Investigation of the Effects of Substrate Orientation on the Solar Efficiency of Conducting Polymer (SPAN) grown on GaAs

2018-04
1st International Conference on Current Nanotechnology and its Applications (ICCNA2018), Irbid, Jordan
N
2017

Investigation of the Effects of Substrate Orientation on the Solar Efficiency and the Electrical Properties of Sulfonated Polyaniline (SPAN) grown on GaAs

2017-12
Iraqi-German Winter School on Nanophotonics, Delmenhorst, Germany
N
2016

Electrical properties of conducting polymer of sulfonated polyaniline (SPAN) grown on conventional (100) and high index and (311)B GaAs substrates

2016-10
10th edition International Conference of Polish Society for crystal Growth (ICPSCG 10), WDW Kościelisko, Zakopane, Poland
N

Electrical Properties of Sulfonated Polyaniline (SPAN) Grown on High Index GaAs Planes Using Current-Voltage, Capacitance and Deep Level Transient Spectroscopy (DLTS)

2016-09
Workshops (Solar Cell Energy), University of Nottingham, Nottingham, United Kingdom
N

Investigation of Defects in Sulfonated Polyaniline (SPAN) Grown on High Index GaAs Planes Using Current-Voltage, Capacitance and Deep Level Transient Spectroscopy (DLTS)

2016-09
18th International Conference on Extended Defects in Semiconductors, EDS2016, Les Issambres, France
N

High-performance organic/inorganic hybrid heterojunction based on Gallium Arsenide (GaAs) substrates and a conjugated polymer

2016-06
40th WOCSDICE & 13th EXMATEC workshops, Aveiro, Portugal
N

Effect of Substrate Orientation on the Solar Efficiency and the Electrical Properties of Sulfonated Polyaniline (SPAN), Grown on (100) and (311)A GaAs

2016-02
5th Anniversary of ANSOLE (2011-2016): International Conference on Renewable Energy (INCORE2016), Cairo, Egypt February 3-6, (2016).
N

Investigation of Defects in Polyaniline (PANI) Grown on High and Low Index GaAs Planes Using Current-Voltage, Capacitance and Deep Level Transient Spectroscopy (DLTS)

2016-02
The 3th international conference on nanotechnology and its applications (ICNA–III-2016), Hurghada, Egypt
No
2015

Effect of Substrate Orientation on the Electrical Properties of Polyaniline deposited on GaAs (100) and (311)B n-Type

2015-07
The 28th International Conference on Defects in Semiconductors ICDS 2015, Aalto University Campus in Espoo, Finland
N

Investigation of Defects in Polyaniline (PANI) Grown on n-Type (100) and (311)A GaAs Substrates Using Current-Voltage, Conductance and Deep Level Transient Spectroscopy (DLTS)

2015-02
Annual Tessella Postgraduate Poster Competition, University of Nottingham, United Kingdom
N
2014

Investigation of Defects in Polyaniline (PANI) Grown on High Index GaAs Planes Using Current-Voltage, Conductance and Deep Level Transient Spectroscopy (DLTS)

2014-09
17th International Conference on Extended Defects in Semiconductors (EDS-2014), Gottingen, Germany, 14-19 September, (2014).
One of the most important class of organic and conjugated polymers is polyaniline (PANI) that possesses excellent optical, electronic, and redox properties [1]. Conductive polymer PANI grown on III-V semiconductor substrates has many advantages in photovoltaic applications [2, 3]. Polymers can be grown over large area with low cost. However, the presence of interfacial states due to the presence of a layer of oxygen over the semiconductor substrate (GaAs) causes serious issues in the performance of these devices. It is therefore vital to have knowledge of interfacial states and types of defects introduced during growth and/or processing. In this work we will report the first systematic studies of PANI grown on n-type (311)A and (311)B GaAs substrates. Current-Voltage-Temperature measurements were performed to determine the ideality factor (n) and barrier height (φB) of the heterojunction using the Schottky barrier model. Capacitance-Conductance-Frequency measurements were carried out at 0V DC bias voltage on both PANI/(311)A GaAs and PANI/(311)B GaAs, and shallow level is detected at the interface. In addition, series resistance (Rs) for both samples have been calculated by Capacitance-Conductance-Frequency measurements. In order to confirm further the type of defects, DLTS measurements are performed with small reverse bias (VR=-0.25V, VP=0V) and forward bias (VR=0V, VP=0.25V). The DLTS technique is powerful technique to determine traps present at the interfaces. The DLTS measurements revealed a hole trap which has almost the same energy as the one detected by conductance measurements. This confirms the defect detected by conductance measurements in both devices is a hole trap that is present in PANI. Moreover, DLTS revealed that both samples PANI/(311)A GaAs and PANI/(311)B GaAs exhibit hole and electron traps. The reverse current-voltage characteristics show that the deep electron trap is one of the major cause of the high reverse current in PANI/(311)A GaAs samples. It is worth pointing out that our PANI/(311)A GaAs and PANI/(311)B GaAs samples have better properties in terms of reverse currents than those previously reported PANI/(100) GaAs [2, 3] devices. [1] S. E. El-Zohary et al., Journal of Nanomaterials, Vol. 2013, p. 8 (2013). [2] F. Yakuphanoglu and B. F. Şenkal, Synthetic Metals, Vol. 158, pp. 821-825 (2008). [3] D. P. Halliday et al., Synthetic Metals, Vol. 102, p. 877 (1999).

Investigation of Defects in Polyaniline (PANI) Grown on n-Type (100) and (311)A GaAs Substrates Using Current-Voltage, Conductance and Deep Level Transient Spectroscopy (DLTS)

2014-09
10th International Conference on Electroluminescence and Organic Optoelectronics, Cologne, Germany
N

Defects Study in Polyaniline (PANI) Grown on GaAs (100) and (311)B n-Type Substrates Using Current-Voltage, Conductance and Deep Level Transient Spectroscopy (DLTS)

2014-05
Materials Challenges in Devices for Fuel Solar Production and Employment, the Abdus Salam International Centre for Theoretical Physics (ICTP), Trieste, Italy
N

Defects study in PANI grown on normal and high index GaAs planes using Current-Voltage, Conductance and Deep Level Transient Spectroscopy

2014-02
Annual Tessella Postgraduate Poster Competition, The University of Nottingham, United Kingdom
N
2013

Defects study in PANI grown on normal and high index GaAs planes using Current-Voltage, Conductance and Deep Level Transient Spectroscopy

2013-09
15th International Conference on Defects–Recognition, Imaging and Physics in Semiconductors (DRIP-XV), Warsaw, Poland
N

Effect of Post Growth Thermal Annealing on Deep Level Defects in MBE Grown Dilute Nitride Ga1−xInxNyAs1−y p-i-n Structures

2013-09
COST MP0805 Final Meeting, Istanbul University, Istanbul, Turkey
N

Effect of Nitrogen on the Optical and Structural Properties of Dilute GaInNAs Double Quantum Wells Grown by MBE on (100), (311)A and (311)B GaAs Substrates

2013-03
17th European Molecular Beam Epitaxy Workshop, Levi, Finland
N
2012

Molecular Beam Epitaxy of Dilute III-V Bismide/Nitride: Development of Emerging Semiconductors for Next Generation Photovoltaics

2012-12
Sustainable Chemical and Biological Processing (SCBP) Priority Group, Nottingham, United Kingdom.
N

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